Welcome to the IoT Slam® Live 2017, Internet of Things Conference, June 21 - 22 2017, R.T.P - North Carolina, USA

Tom van de Ven

Senior test consultant High Tech at Sogeti

Tom van de Ven

Senior test consultant High Tech at Sogeti

Biography

Tom van de Ven

Tom van de Ven is 13 years active in the field of High Tech testing. As a High Tech test expert he is a frequently asked sparring partner for Sogeti High Tech customers with regard to test projects. He is author of the book IoTMap that expands TMap into the world of Internet of Things. Being a member of SogetiLabs and an ambassador for the SPIRIT within the Cap Gemini group, he is a recognised international authority on IoT and High Tech testing. Besides a multitude of test assignments (i.e. in the field of healthcare, semiconductors, agriculture, automotive) he is the leader of the Sogeti High Tech Test Competence Centre and a regular speaker on international seminars. You can find regular publications and blogs on the SogetiLabs platform. Tom uses his experience in a role as a coach for (starting) High Tech test engineers and is constantly looking for improvements in High Tech test methodologies. He also teaches and develops a wide variety of testing courses in the embedded and high tech domain.

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IoT Slam Internet of Things Conference

IoT Slam Internet of Things Conference

All session by Tom van de Ven